![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Roy S. Jacob C. Basu S.
Publisher: Elsevier
ISSN: 0038-1101
Source: Solid-State Electronics, Vol.47, Iss.11, 2003-11, pp. : 2035-2041
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)