Reduction of effective barrier height and low-frequency noise of Al-GaAs Schottky contacts by hydrocarbon ion beam irradiation

By Meskinis S.   Balcaitis G.   Matukas J.   Palenskis V.  

Solid-State Electronics, Vol. 47, Iss. 10, 2003-10 ,pp. : 1713-1718

Elsevier

Access to resources Recommend Favorite

Reliability aspects of semiconductor devices in high temperature applications

By Kanert W.   Dettmer H.   Plikat B.   Seliger N.  

Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. : 1839-1846

Elsevier

Access to resources Recommend Favorite

Excess low-frequency noise in YBCO rf SQUIDs in weak magnetic fields

By Foley C.P.   Lam S.   Leslie K.E.   Muller K.-H.   Binks R.A.   Macks L.   Sloggett G.J.  

Applied Superconductivity, Vol. 6, Iss. 10, 1999-10 ,pp. : 669-673

Elsevier

Access to resources Recommend Favorite

Substitutional incorporation of Sn in compressively strained thin films of heavily-alloyed Ge_{1 − x}Sn _x /Ge semiconductor probed by x-ray absorption and diffraction methods

By Soo Y L   Wu T S   Chen Y C   Shiu Y F   Peng H J   Tsai Y W   Liao P Y   Zheng Y Z   Chang S L   Chan T S   Lee J F   Sterbinsky G E   Li H   Cheng H H  

Semiconductor Science and Technology, Vol. 29, Iss. 11, 2014-11 ,pp. : 115008-115013

IOP Publishing

Access to resources Recommend Favorite

Low-frequency noise measurements on submicrometre n-channel and p-channel MOSFETs at various operating regions

By Belahrach H.   Degerli Y.   Lavernhe F.   Karim M.   Magnan P.   Farre J.  

International Journal of Electronics, Vol. 88, Iss. 4, 2001-04 ,pp. : 411-421

Taylor & Francis Ltd

Access to resources Recommend Favorite