The effect of annealing on the 0.5% Ce-doped Ba(Zr x Ti 1-x )O 3 (BZT) thin films deposited by RF magnetron sputtering system

Author： Choi W.S.   Boo J.-H.   Yi J.   Hong B.  

Publisher： Elsevier

ISSN： 1369-8001

Source： Materials Science in Semiconductor Processing, Vol.5, Iss.2, 2002-04, pp. : 211-214

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