Author: Orlov V. Richter H. Fischer A. Reif J. Muller T. Wahlich R.
Publisher: Elsevier
ISSN: 1369-8001
Source: Materials Science in Semiconductor Processing, Vol.5, Iss.4, 2002-08, pp. : 403-407
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract