Nano-scale analysis of precipitates in nitrogen-doped Czochralski silicon

Author: Rozgonyi G.A.   Karoui A.   Kvit A.   Duscher G.  

Publisher: Elsevier

ISSN: 0167-9317

Source: Microelectronic Engineering, Vol.66, Iss.1, 2003-04, pp. : 305-313

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Abstract