Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy

By Fruhstorfer B.   Mohles V.   Reichelt R.   Nembach E.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 13, 2002-09 ,pp. : 2575-2589

Taylor & Francis Ltd

Access to resources Recommend Favorite

Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

By Sobchenko I.  

Philosophical Magazine, Vol. 87, Iss. 16-17, 2007-01 ,pp. : 2427-2460

Taylor & Francis Ltd

Access to resources Recommend Favorite

Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

By Sobchenko I.  

Philosophical Magazine, Vol. 87, Iss. 17, 2007-01 ,pp. : 2427-2460

Taylor & Francis Ltd

Access to resources Recommend Favorite

In-situ atomic force microscopy and transmission electron microscopy observations of the deformation of MC2 nickel-based superalloy gamma phase

By Coupeau C.   Brochard S.   Jouiad M.   Coujou A.   Grilhe J.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 79, Iss. 3, 1999-03 ,pp. : 627-638

Taylor & Francis Ltd

Access to resources Recommend Favorite

Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy

By Wohl G.   Schollhorn C.   Schmidt O.G.   Brunner K.   Eberl K.   Kienzle O.   Ernst F.  

Thin Solid Films, Vol. 321, Iss. 1, 1998-05 ,pp. : 86-91

Elsevier

Access to resources Recommend Favorite