Author: S.Honma K.Tateyama** H.Yamada** K.Doi N.Hirano T.Okada H.Aoki Y.Hiruta Sudo*** T
Publisher: Emerald Group Publishing Ltd
ISSN: 1356-5362
Source: Microelectronics International, Vol.14, Iss.3, 1997-03, pp. : 47-50
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Abstract
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