Author: Palmer Mark Alexander Christy Nguyen Brian
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.28, Iss.7, 1999-07, pp. : 912-915
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Sigelko J. Choi S. Subramanian K. Lucas J.
Journal of Electronic Materials, Vol. 29, Iss. 11, 2000-11 ,pp. :
Effect of voids on the reliability of BGA/CSP solder joints
By Yunus M. Srihari K. Pitarresi J.M. Primavera A.
Microelectronics Reliability, Vol. 43, Iss. 12, 2003-12 ,pp. :