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Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

Oxford University Press

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Removing focused ion-beam damages on transmission electron microscopy specimens by using a plasma cleaner

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Oxford University Press

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Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current

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Interferometry by Coherent Convergent-Beam Electron Diffraction

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Recent Advances in Quantitative Convergent Beam Electron Diffraction

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