Development of a through wafer 3D vertical micro-coaxial probe

Author: Boone Justin   Krishnan Subramanian   Bhansali Shekhar  

Publisher: IOP Publishing

ISSN: 0960-1317

Source: Journal of Micromechanics and Microengineering, Vol.23, Iss.7, 2013-06, pp. : 75029-75035

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