Analysis of mineral water from Brazil using total reflection X-ray fluorescence by synchrotron radiation

By Costa A.C.M.   Anjos M.J.   Moreira S.   Lopes R.T.   de Jesus E.F.O.  

Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, Iss. 12, 2003-12 ,pp. : 2199-2204

Elsevier

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Analysis of beers from Brazil with synchrotron radiation total reflection X-ray fluorescence

By Moreira S.   Vives A. E. S.   Zucchi O. L. A. D.   de Jesus E. F. O.   Nascimento Filho V. F.   Brienza S. M. B.  

Journal of Radioanalytical and Nuclear Chemistry, Vol. 270, Iss. 1, 2006-10 ,pp. : 167-171

Springer Publishing Company

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A wavelength-dispersive arrangement for wafer analysis with total reflection X-ray fluorescence spectrometry using synchrotron radiation

By Schwenke H.   Beaven P.A.   Knoth J.   Jantzen E.  

Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, Iss. 12, 2003-12 ,pp. : 2039-2048

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Elemental concentration in the cortex and hippocampus of Wistar rats by X-ray total reflection fluorescence with synchrotron radiation

By Serpa R. F. B.   De Jesus E. F. O.   Anjos M. J.   Lopes R. T.   do Carmo M. G. T.   Moreira S.   Rocha M. S.   Martinez A. M. B.  

Journal of Radioanalytical and Nuclear Chemistry, Vol. 269, Iss. 3, 2006-09 ,pp. : 647-652

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Analysis of depth profile for impurity concentration in Si wafer by synchrotron radiation excited total reflection X-ray fluorescence spectroscopy

By Huh B.-K.   Kim J.-S.   Shin N.-S.   Koo Y.-M.   Chung H.-Y.  

Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, Iss. 8, 2003-08 ,pp. : 1445-1452

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