Coupling of carriers injection and charges distribution in Schottky barrier charge-trapping memories using source-side electrons programming

Author： Luo Yan-Xiang   Shih Chun-Hsing  

Publisher： IOP Publishing

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.29, Iss.11, 2014-11, pp. : 115006-115013

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