Improvement of feature-scale profile evolution in a silicon dioxide plasma etching simulator using the level set method

Author: Montoliu C   Baer E   Cerdá J   Colom R J  

Publisher: IOP Publishing

E-ISSN: 1361-6439|25|6|65013-65023

ISSN: 0960-1317

Source: Journal of Micromechanics and Microengineering, Vol.25, Iss.6, 2015-06, pp. : 65013-65023

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