Author: Chunlei Zheng Hongbin Pu Hong Li Zhiming Chen
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.5, 2015-05, pp. : 54009-54011
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Vivona M Greco G Giannazzo F Nigro R Lo Rascunà S Saggio M Roccaforte F
Semiconductor Science and Technology, Vol. 29, Iss. 7, 2014-07 ,pp. :
Ohmic contact properties of Ni/C film on 4H-SiC
By Lu W. Mitchel W.C. Landis G.R. Crenshaw T.R. Collins W.E.
Solid-State Electronics, Vol. 47, Iss. 11, 2003-11 ,pp. :