Signature of dislocations and stacking faults of face‐centred cubic nanocrystals in coherent X‐ray diffraction patterns: a numerical study

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|3|621-644

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.3, 2015-06, pp. : 621-644

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