Boosting the total ionizing dose tolerance of digital switches by using OCTO SOI MOSFET

Author: Renaux Christian   Flandre Denis   Renaux Christian   Renaux Christian   Renaux Christian   Renaux Christian  

Publisher: IOP Publishing

E-ISSN: 1361-6641|30|10|105024-105035

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.30, Iss.10, 2015-10, pp. : 105024-105035

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract