Reliable structural data from Rietveld refinements via restraint consistency

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|6|1777-1784

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.6, 2015-12, pp. : 1777-1784

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