Residual stress determination in a shot‐peened nickel‐based single‐crystal superalloy using X‐ray diffraction

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|6|1761-1776

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.6, 2015-12, pp. : 1761-1776

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

A new micro‐furnace for in situ high‐temperature single‐crystal X‐ray diffraction measurements

By  

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 4, 2015-08 ,pp. : 1192-1200

John Wiley & Sons Inc

Access to resources Recommend Favorite

Removing multiple outliers and single‐crystal artefacts from X‐ray diffraction computed tomography data

By  

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 6, 2015-12 ,pp. : 1943-1955

John Wiley & Sons Inc

Access to resources Recommend Favorite

Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing‐incidence X‐ray diffraction

By  

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 2, 2015-04 ,pp. : 492-509

John Wiley & Sons Inc

Access to resources Recommend Favorite

At last! The single‐crystal X‐ray structure of a naturally occurring sample of the ilmenite‐type oxide FeCrO3

By  

ACTA CRYSTALLOGRAPHICA SECTION B (ELECTRONIC), Vol. 71, Iss. 5, 2015-10 ,pp. : 555-561

John Wiley & Sons Inc

Access to resources Recommend Favorite

Diffraction imaging for in situ characterization of double‐crystal X‐ray monochromators

By  

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 6, 2015-12 ,pp. : 1734-1744

John Wiley & Sons Inc

Access to resources Recommend Favorite