![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Lei Cui Haibo Yin Lijuan Jiang Quan Wang Chun Feng Hongling Xiao Cuimei Wang Jiamin Gong Bo Zhang Baiquan Li Xiaoliang Wang Zhanguo Wang
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.10, 2015-10, pp. : 103002-103005
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Ni Yiqiang Zhou Deqiu Chen Zijun Zheng Yue He Zhiyuan Yang Fan Yao Yao Zhou Guilin Shen Zhen Zhong Jian Wu Zhisheng Zhang Baijun Liu Yang
Semiconductor Science and Technology, Vol. 30, Iss. 10, 2015-10 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)