Importance of frequency-dependent grain boundary scattering in nanocrystalline silicon and silicon–germanium thermoelectrics

Publisher: IOP Publishing

E-ISSN: 1361-6641|29|12|124004-124011

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.29, Iss.12, 2014-12, pp. : 124004-124011

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