Author: Luo B. Mehandru R. Kang B.S. Kim J. Ren F. Gila B.P. Onstine A.H. Abernathy C.R. Pearton S.J. Gotthold D. Birkhahn R. Peres B. Fitch R. Gillespie J.K. Jenkins T. Sewell J. Via D. Crespo A.
Publisher: Elsevier
ISSN: 0038-1101
Source: Solid-State Electronics, Vol.48, Iss.2, 2004-02, pp. : 355-358
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
By Luo B. Mehandru R. Kim J. Ren F. Gila B.P. Onstine A.H. Abernathy C.R. Pearton S.J. Gotthold D. Birkhahn R. Peres B. Fitch R.C. Moser N. Gillespie J.K. Jessen G.H. Jenkins T.J. Yannuzi M.J. Via G.D. Crespo A.
Solid-State Electronics, Vol. 47, Iss. 10, 2003-10 ,pp. :