SiGe/SiGeO 2 interface defects

Author: Lebib S.   Schoisswohl M.   Cantin J.L.   Von Bardeleben H.J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.294, Iss.1, 1997-02, pp. : 242-245

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Abstract