Device-quality polycrystalline silicon films deposited at low process temperatures by hot-wire chemical vapor deposition

Author: Saha S.C.   Guillet J.   Equer B.   Bouree J.E.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.337, Iss.1, 1999-01, pp. : 248-252

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