Effect of substrate temperature on the texture and structure of polycrystalline Si 0.7 Ge 0.3 films deposited on SiO 2 by molecular beam deposition

Author: Seung Kim H.   Yong Lee J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.350, Iss.1, 1999-08, pp. : 14-20

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