Growth and characterization of SiC layers obtained by microwave-CVD

Author: Mandracci P.   Ferrero S.   Cicero G.   Giorgis F.   Pirri C.F.   Barucca G.   Reitano R.   Musumeci P.   Calcagno L.   Foti G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.383, Iss.1, 2001-02, pp. : 169-171

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Abstract