![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Fonrodona M. Gordijn A. van Veen M.K. van der Werf C.H.M. Bertomeu J. Andreu J. Schropp R.E.I.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.430, Iss.1, 2003-04, pp. : 145-148
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Electrical transport properties of microcrystalline silicon thin films prepared by Cat-CVD
By Liu F. Zhu M. Feng Y. Han Y. Liu J.
Thin Solid Films, Vol. 395, Iss. 1, 2001-09 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)