![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Britton D.T. Sigcau Z. Comrie C.M. Kanguwe D.F. Minani E. Knoesen D. Harting M.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.430, Iss.1, 2003-04, pp. : 149-152
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Deposition, defect and weak bond formation processes in a-Si:H
Thin Solid Films, Vol. 337, Iss. 1, 1999-01 ,pp. :