Imaging of fullerene-like structures in CN x thin films by electron microscopy; sample preparation artefacts due to ion-beam milling

By Czigany Z.   Neidhardt J.   Brunell I.F.   Hultman L.  

Ultramicroscopy, Vol. 94, Iss. 3, 2003-04 ,pp. : 163-173

Elsevier

Access to resources Recommend Favorite

Heating of TEM specimens during ion milling

By Viguier B.   Mortensen A.  

Ultramicroscopy, Vol. 87, Iss. 3, 2001-04 ,pp. : 123-133

Elsevier

Access to resources Recommend Favorite

Field-ion specimen preparation using focused ion-beam milling

By Larson D.J.   Foord D.T.   Petford-Long A.K.   Liew H.   Blamire M.G.   Cerezo A.   Smith G.D.W.  

Ultramicroscopy, Vol. 79, Iss. 1, 1999-09 ,pp. : 287-293

Elsevier

Access to resources Recommend Favorite

Focused ion-beam milling for field-ion specimen preparation: - preliminary investigations

By Larson D.J.   Foord D.T.   Petford-Long A.K.   Anthony T.C.   Rozdilsky I.M.   Cerezo A.   Smith G.W.D.  

Ultramicroscopy, Vol. 75, Iss. 3, 1998-12 ,pp. : 147-159

Elsevier

Access to resources Recommend Favorite

Development of refractory ohmic contact materials for gallium arsenide compound semiconductors

By  

Science and Technology of Advanced Materials, Vol. 3, Iss. 1, 2002-03 ,pp. : 1-27

IOP Publishing

Access to resources Recommend Favorite