Author: David R.
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.18, Iss.2, 2002-04, pp. : 145-157
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Modeling Fault Coverage of Random Test Patterns
By Cui H.
Journal of Electronic Testing, Vol. 19, Iss. 3, 2003-06 ,pp. :