An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits

Author： LeCoupanec P.   Lo W.K.   Wilsher K.R.  

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1621-1626

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