Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.

Author： Darracq F. Lapuyade H. Buard N. Fouillat P. Dufayel R. Carriere T.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1615-1619

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