Author: Azzopardi S. Woirgard E. Vinassa J.-M. Briat O. Zardini C.
Publisher: Elsevier
ISSN: 0026-2714
Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1901-1906
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Abstract
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Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. :