Polarization fatigue in asymmetric-field-driven ferroelectric thin films

Author: Wang Y.   Wong K.H.   Shin F.G.   Choy C.L.  

Publisher: Elsevier

ISSN: 0167-9317

Source: Microelectronic Engineering, Vol.66, Iss.1, 2003-04, pp. : 806-812

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Abstract