Author： Zolper J. Han J. Biefeld R. Deusen S. Wampler W. Reiger D. Pearton S. Williams J. Tan H. Karlicek R. Stall R.
Publisher： Springer Publishing Company
ISSN： 1543-186X
Source： Journal of Electronic Materials, Vol.27, Iss.4, 1998-04, pp. : 179-184
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