Stress testing of a recrystallizing CaO-B 2 O 3 -SiO 2 glass-ceramic with Ag electrodes for high frequency electronic packaging

Author： Shapiro Andrew Kubota Neil Yu Karl Mecartney Martha

Publisher： Springer Publishing Company

ISSN： 1543-186X

Source： Journal of Electronic Materials, Vol.30, Iss.4, 2001-04, pp. : 386-390

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Rayleigh Scattering in K₂O–MgO–SiO₂ and Na₂O–B₂O₃–SiO₂ Glasses

By Tsujikawa K. Ohashi M.

Optical Fiber Technology, Vol. 6, Iss. 1, 2000-01 ,pp. : 74-82

Academic Press

Access to resources Recommend Favorite

Growth of CsLiB 6 O 10 thin films on Si substrate by pulsed laser deposition using SiO 2 and CaF 2 as buffer layers

By Yeo J. Akella A. Huang T. Hesselink L.

Journal of Electronic Materials, Vol. 27, Iss. 3, 1998-03 ,pp. : 127-131

Springer Publishing Company

Access to resources Recommend Favorite

Anisotropic Etching of SiO₂ in High-Voltage Gas-Discharge Plasmas

By Kazanskii N. L. Kolpakov V. A. Kolpakov A. I.

Russian Microelectronics, Vol. 33, Iss. 3, 2004-05 ,pp. : 169-182

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Direct bonding of Si wafer pairs with SiO 2 and Si 3 N 4 films with a fast linear annealing

By Lee S.H. Song O. Yoon C.S. Kim C.K.

Materials Science in Semiconductor Processing, Vol. 5, Iss. 6, 2002-12 ,pp. : 519-524

Elsevier

Access to resources Recommend Favorite

The plasmon resonance absorption of Ag/SiO 2 nanocomposite films

By Yang L. Liu Y. Wang Q. Shi H. Li G. Zhang L.

Microelectronic Engineering, Vol. 66, Iss. 1, 2003-04 ,pp. : 192-198

Elsevier

Access to resources Recommend Favorite