Microstructural Variation and Phase Evolution in the Reaction of Sn- x Ag-Cu Solders and Cu- y Zn Substrates During Reflow

Author: Yu Chi-Yang  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.39, Iss.12, 2010-12, pp. : 2627-2635

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract