A new procedure to extract the threshold voltage of MOSFETs using noise-reduction techniques

Author: Picos R.   Roca M.   Iniguez B.   Garcia-Moreno E.  

Publisher: Elsevier

ISSN: 0038-1101

Source: Solid-State Electronics, Vol.47, Iss.11, 2003-11, pp. : 1953-1958

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