A review of leakage current in SOI CMOS ICs: impact on parametric testing techniques

Author： Iniguez B. Raskin J.-P. Simon P. Flandre D. Segura J.

Publisher： Elsevier

ISSN： 0038-1101

Source： Solid-State Electronics, Vol.47, Iss.11, 2003-11, pp. : 1959-1967

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