Study on the AlN/Si(111) interface properties

Author: Xi D.J.   Zheng Y.D.   Chen P.   Chu R.M.   Gu S.L.   Shen B.   Zhang R.  

Publisher: Elsevier

ISSN: 0925-3467

Source: Optical Materials, Vol.23, Iss.1, 2003-07, pp. : 143-146

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