Effects of Postannealing Temperature on the Band Alignments and Interfacial Properties of Atomic Layer Deposited Al2O3 on Ge Substrates

Author: Li Xue-Fei   Liu Xiao-Jie   Fu Ying-Ying   Li Ai-Dong   Li Hui   Wu Di  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.134, Iss.1, 2012-01, pp. : 16-21

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