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Author: Zhang Z. Zhang S. Feng C. Chan M.
Publisher: Elsevier
ISSN: 0038-1101
Source: Solid-State Electronics, Vol.47, Iss.10, 2003-10, pp. : 1829-1833
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Performance assessment of scaled strained-Si channel-on-insulator (SSOI) CMOS
By Kim K. Chuang C.-T. Rim K. Joshi R.V.
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