Electronic and topographic properties of amorphous and microcrystalline silicon thin films

Author: Kleider J.P.   Longeaud C.   Bruggemann R.   Houze F.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.383, Iss.1, 2001-02, pp. : 57-60

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Abstract