The influence of the filament temperature on the structure of hot-wire deposited silicon

Author: van der Werf C.H.M.   van Veenendaal P.A.T.T.   van Veen M.K.   Hardeman A.J.   Rusche M.Y.S.   Rath J.K.   Schropp R.E.I.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.430, Iss.1, 2003-04, pp. : 46-49

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Abstract