Single contact beam induced current phenomenon for microelectronic failure analysis

Author： Phang J. Chan D. Ong V. Kolachina S. Chin J. Palaniappan M. Gilfeather G. Seah Y.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1595-1602

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