Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)

By Beauchene T.   Tremouilles D.   Lewis D.   Perdu P.   Fouillat P.  

Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. : 1577-1582

Elsevier

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Analysis and Prevention on NC-ball induced ESD Damages in a 683-Pin BGA Packaged Chipset IC

By Lo W.-Y.   Ker M.-D.  

Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. : 1583-1588

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Modeling of Thermally Induced Stresses in Three-Dimensional Bonded Integrated Circuit Wafers

By Zhang Jing  

Journal of Electronic Materials, Vol. 40, Iss. 5, 2011-05 ,pp. : 670-673

Springer Publishing Company

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Investigation of the trigger voltage walk-in effect in LDMOS for high-voltage ESD protection

By Hailian Liang   Shurong Dong   Xiaofeng Gu   Lei Zhong   Jian Wu   Zongguang Yu  

Journal of Semiconductors, Vol. 35, Iss. 9, 2014-09 ,pp. : 94005-94008

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Impact of parasitic resistance on the ESD robustness of high-voltage devices

By Lijuan Lin   Lingli Jiang   Hang Fan   Bo Zhang  

Journal of Semiconductors, Vol. 33, Iss. 1, 2012-01 ,pp. : 14005-14009

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