Avalanche breakdown capability of Power DMOS Transistors and the Wunsch-Bell relation

Author： Deckelmann A.I.   Wachutka G.   Hirler F.   Krumrey J.   Henninger R.  

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1895-1900

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