Author: Ren T.-L. Shao T.-Q. Zhang W.-Q. Li C.-X. Liu J.-S. Liu L.-T. Zhu J. Li Z.-J.
Publisher: Elsevier
ISSN: 0167-9317
Source: Microelectronic Engineering, Vol.66, Iss.1, 2003-04, pp. : 554-560
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
High quality silicon-based PZT thin films for memory applications
By Shao T.-Q. Ren T.-L. Wang X.-N. Zhu J. Liu L.-T. Li Z.-J.
Microelectronic Engineering, Vol. 66, Iss. 1, 2003-04 ,pp. :