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Author: Ren T.-L. Shao T.-Q. Zhang W.-Q. Li C.-X. Liu J.-S. Liu L.-T. Zhu J. Li Z.-J.
Publisher: Elsevier
ISSN: 0167-9317
Source: Microelectronic Engineering, Vol.66, Iss.1, 2003-04, pp. : 554-560
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
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