New spectroscopic data of erbium ions in GaN thin films

Author： Pelle F.   Auzel F.   Zavada J.M.   Lee D.S.   Steckl A.J.  

Publisher： Elsevier

ISSN： 0921-5107

Source： Materials Science and Engineering: B, Vol.105, Iss.1, 2003-12, pp. : 125-130

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