Etching Properties of HfO2 Thin Films in Cl2/BCl3/Ar Plasma

Author: Kim Dong-Pyo   Kim Gwan-Ha   Woo Jong-Chang   Yang Xue   Um Doo-Seung   Kim Chang-Il  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.381, Iss.1, 2009-01, pp. : 30-40

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Abstract