New electron and hole traps in GaAsP alloy

Author: Teo K. L.   Li M. F.   Goo C. H.   Lau W. S.   Lim Y. T.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.83, Iss.1, 1997-07, pp. : 29-36

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Abstract